Vicor's Power Modules Improve Automated Test Equipment Throughput and Uptime

     Vicor's high-density, high-efficiency power modules enable ATE system design engineers to implement Power Delivery Network (PDN) architectures, allowing increased test head pin counts in the same or smaller footprint. Data center, military, automotive, and industrial ICs consume ever-increasing amounts of power and have many different voltage levels.

     Vicor's modular approach to PDN enables ATE manufacturers to easily scale power levels and support different voltages, enabling rapid development and rapid time-to-market. Semiconductor manufacturers are placing higher demands on automatic test equipment (ATE) companies, looking to design test systems that can quickly and reliably meet growing IC demands with as little additional cost as possible.

     IC manufacturers see cost of test (CoT) as a cost-increasing factor that, while needed and necessary, only reduces product margins, requires ever-increasing factory floor space, and does not improve cycle times and yields. ATE system manufacturers need to develop test systems that meet the technical needs of IC products without yield loss and occupy the same or less factory floor space as the product being replaced.