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SN74BCT8374ADWR

SN74BCT8374ADWR
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For Reference Only

Part Number SN74BCT8374ADWR
OEMstron Part # SN74BCT8374ADWR
Manufacturer Texas Instruments
Category SemiconductorsLogic ICsSpecialty Logic
Description IC SCAN TEST DEVICE W/FF 24-SOIC
Lifecycle Obsolete
RoHS No RoHS Information
EDA/CAD Models SN74BCT8374ADWR PCB Footprint and Symbol
Warehouses USA, Europe, China, Hong Kong SAR
Estimated Delivery May 31 - Jun 5 (Choose Expedited Shipping)
Warranty Up to 1 year [Limited-Warranty]*
Payment Wire Transfer, UnionPay, PayPal, Credit Card, Visa, MasterCard, AmericanExpress, Discover, WesternUnion, MoneyGram
Shipping DHL, UPS, FedEx, TNT, EMS, & More Express Delivery

SN74BCT8374ADWR Specifications

Part Number SN74BCT8374ADWR
Brand Texas Instruments
Lifecycle Obsolete
RoHS No RoHS Information
Product Line Semiconductors
Category Logic ICs
Subcategory Specialty Logic
Manufacturer
Series 74BCT
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295", 7.50mm Width)
Supplier Device Package 24-SOIC

SN74BCT8374ADWR Documents

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Part Number Description Stock

SN74BCT8374ADW

D# V36:1790_07335374

Texas Instruments

Scan Test Device

RoHS: Compliant
Americas - 0
Part Number Description Stock

SN74BCT8374ADW

Texas Instruments

30
Part Number Description Stock

SN74BCT8374ADWR

Texas Instruments

N/A BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 PLASTIC, SO-24

1000

SN74BCT8374ADWRG4

Texas Instruments

IC SCAN TEST DEVICE 24SOIC

Contact Us

SN74BCT8374ADW

Texas Instruments

SCAN TEST DEVICE, D-FLIP FLOP SOIC24, Flip-Flop Type:D, Propagation Delay:6.7ns, Supply Voltage Min:4.5V, Supply Voltage Max:5.5V, Logic Case Style:SOIC, No. of Pins:24, Frequency:70MHz, Output Current:64mA, Packaging:Each , RoHS Compliant: Yes

Contact Us

SN74BCT8374ADWRE4

Rochester Electronics LLC

74BCT8374 Flip Flop SN74BCT8374ADWRE4

0
Part Number Description Stock

SN74BCT8374ADWR

D# SN74BCT8374ADWR-ND

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-SOIC

Limited Supply - Call

SN74BCT8374ADWRG4

D# SN74BCT8374ADWRG4-ND

Texas Instruments

IC SCAN TEST DEVICE 24SOIC

Limited Supply - Call

SN74BCT8374ADWRE4

D# SN74BCT8374ADWRE4-ND

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-SOIC

Limited Supply - Call

SN74BCT8374ADW

D# 296-33849-5-ND

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-SOIC

75 In Stock
Part Number Description Stock

SN74BCT8374ADWR

OEM/CM QUOTES ONLY | NO BROKERS

2378

SN74BCT8374ADW

OEM/CM QUOTES ONLY | NO BROKERS

3154
Part Number Description Stock

SN74BCT8374ADWR

Texas Instruments

OEM/CM ONLY

1060

SN74BCT8374ADW

Texas Instruments

OEM/CM ONLY

862

SN74BCT8374ADWR00

Texas Instruments

OEM/CM ONLY

536

SN74BCT8374ADWRE4

Texas Instruments

OEM/CM ONLY

306
Part Number Description Stock

SN74BCT8374ADW

D# 595-SN74BCT8374ADW

Texas Instruments

Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop

RoHS: Compliant
104
Part Number Description Stock

SN74BCT8374ADW

D# NS-SN74BCT8374ADW

Texas Instruments

OEM/CM ONLY

5626

SN74BCT8374ADWRE4

D# NS-SN74BCT8374ADWRE4

Texas Instruments

OEM/CM ONLY

1821

SN74BCT8374ADWRG4

D# NS-SN74BCT8374ADWRG4

Texas Instruments

OEM/CM ONLY

5376

SN74BCT8374ADWR

D# NS-SN74BCT8374ADWR

Texas Instruments

OEM/CM ONLY

5215
Part Number Description Stock

SN74BCT8374ADWR

Texas Instruments

OEM/CM ONLY

3020

SN74BCT8374ADW

Texas Instruments

OEM/CM ONLY

3797
Part Number Description Stock

SN74BCT8374ADW

Texas Instruments

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops

996
Part Number Description Stock

SN74BCT8374ADW

Texas Instruments

shipping today

3009
Part Number Description Stock

SN74BCT8374ADW

Texas Instruments

RFQ

9504

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